MuAnalysis Inc. Acquires State-of-the-Art Scanning Acoustic Microscopy for its Microelectronic Diagnostic and Failure Testing Services

OTTAWA, Ontario, March 22, 2017 -- MuAnalysis Inc., the provider of advanced high technology analytical services and a wholly owned subsidiary of Grafoid Inc. is pleased to announce the addition of an advanced, high resolution scanning acoustic tomography to its family of diagnostic technologies.

Scanning Acoustic Tomography testing at MuAnalysis’ laboratories in Ottawa, Ontario MuAnalysis

A photo accompanying this announcement is available at http://www.globenewswire.com/NewsRoom/AttachmentNg/dfbbb5ad-923c-47f4-b339-b08ca96d4c28

Microelectronics and semiconductor manufacturers and their customers deem third party verification as an essential component for the development of advanced integrated circuit and material technologies. Because of the high cost of analytical services generally, customers require fast feedback of results especially for non-destructive techniques.

MuAnalysis President Dr. Martine Simard-Normandin said the addition of the one of the most advanced flaw verification technologies in the world for electronic devices and materials leaves the company well positioned to expand its services to meet the growing needs of customers in Eastern North America and elsewhere.

She said the advanced acoustic scanning device presents MuAnalysis with state-of-the-art diagnostic capabilities for identifying defects with greater speed and accuracy as microelectronic multi-layered materials have become increasing fine and complex.

“The addition of the Hitachi FineSat V to our family of semiconductor diagnostic equipment enhances our services by providing very high resolution acoustic images using a large selection of transducers,” Dr. Simard-Normandin said.

In principle, she explained, the ultrasound device is similar to clinical ultrasound devices that detect physical anomalies in medical diagnostics but with greater accuracy and image clarity.

Scanning Acoustic Microscopy (SAM) is a quick, non-destructive analysis technique used for counterfeit detection, product reliability testing, vendor qualification, quality control and failure analysis.

SAM uses ultrasound waves to detect changes in acoustic impedances in integrated circuits (ICs) and other similar materials. High frequency pulses are used to penetrate various materials to examine sample interiors for voids or delamination. In tomography mode, images of the device are created at different depths.

Typical applications include the evaluation of die attach integrity, heat speader adhesion, solder bump quality, and; the detection of die surface adhesion and metallization burnout.

MuAnalysis’ expert analytic services encompass but are not limited to: electronics, photonics, metals, security, defense, aerospace, automotive, pharmaceutical, textile and bio-medical sectors.

They also include investigations related to intellectual property violation from the reverse engineering of manufactured products, LED and luminaire failure and battery testing.

About MuAnalysis

MuAnalysis is an independent Ottawa-based laboratory. Our scientific team provides expertise in semiconductor design verification and reliability testing, as well as failure and materials analysis. MuAnalysis has a proven track record of saving TIME and MONEY for electronic manufacturing, materials transformation, fabless semiconductor and photonics companies worldwide. Our customers reduce their design cycle time, minimize their customer returns, and maximize their product yields by using the services of MuAnalysis, a wholly owned subsidiary of Grafoid. Additional information is available at www.muanalysis.com.

Contact:
Martine Simard-Normandin, PhD
President
MuAnalysis Inc.
+1 866 238 4664
[email protected]